Nanotechnology and nanoelectronics : materials devices measurement techniques

By:

Fahrner, W. R

Material type: Text

TextPublication details: New York Springer 2005Description: 269 pISBN:

9783662606223

Subject(s):

DDC classification:

621.381 FAH

Summary: This book provides a concise and didactically structured presentation of nanotechnology as matters stand. Both students and engineers can gain valuable insights into the historical development, production, and characterization procedures of structures in the nanometer range, their electrical applications, measuring procedures for the determination of nanodefect, nanolayer, and nanoparticle characteristics, and the major techniques of preparation in nanotechnology. Based on known facts, an evaluation of nanotechnology, its further development, and its future prospects are attempted.

Tags from this library: No tags from this library for this title. Log in to add tags.

Average rating: 0.0 (0 votes)

Holdings
Item type	Current library	Collection	Call number	Status	Date due	Barcode
Book	Plaksha University Library	Technology	621.381 FAH (Browse shelf(Opens below))	Available		001089

Browsing Plaksha University Library shelves, Collection: Technology Close shelf browser (Hides shelf browser)

Previous								Next
Previous	621.3675 PEL Envisioning holograms : design breakthrough experiences for mixed reality	621.381 BEL Electronic devices and circuit	621.381 BUS Essentials of electronic testing for digital memory and mixed-signal VLSI circuits	621.381 FAH Nanotechnology and nanoelectronics : materials devices measurement techniques	621.381 ROH Digital systems design using VHDL	621.3813 POZ Microwave engineering	621.38132 DAS Radio Frequency Circuit Design	Next

This book provides a concise and didactically structured presentation of nanotechnology as matters stand. Both students and engineers can gain valuable insights into the historical development, production, and characterization procedures of structures in the nanometer range, their electrical applications, measuring procedures for the determination of nanodefect, nanolayer, and nanoparticle characteristics, and the major techniques of preparation in nanotechnology. Based on known facts, an evaluation of nanotechnology, its further development, and its future prospects are attempted.

There are no comments on this title.

to post a comment.